Database of Zeolite Structures
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Framework
2-aminopentane Nonasil
XPD
Calculated pattern
2-aminopentane Nonasil
Measured pattern
Nonasil as-made
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NON
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NON
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Powder Pattern
Framework Type
NON
Powder Diffraction Pattern for 2-aminopentane Nonasil
Input Parameters
Wavelength:
As specified
CrA1 (2.28970 Å)
CrA2 (2.29361 Å)
Cr (2.29090 Å)
FeA1 (1.93604 Å)
FeA2 (1.93998 Å)
>Fe (1.93730 Å)
CuA1 (1.54056 Å)
CuA2 (1.54439 Å)>
Cu (1.54180 Å)
MoA1 (0.70930 Å)
MoA2 (0.71359 Å)
Mo (0.71070 Å)
AgA1 (0.55941 Å)
AgA2 (0.56380 Å)
Ag (0.56080 Å)
or
Å
keV
2θ range:
° -
°
Step size:
°2θ
Polarization factor:
Background:
Reference peak is
highest peak in 2θ range
peak closest to
°2θ
reflection (
hkl
)
scaled to
Intensity axis:
-
Peak shape
Pseudo-Voigt: (1-
n
)Gaussian +
n
Lorentzian
FWHM = sqrt (U + V tan θ + W tan
2
θ)
Mixing parameter (
n
):
%
Peak range:
FWHM
Peak width:
set UVW at:
U =
V =
W =
Calculate UVW such that
FWHM =
at
°2θ
FWHM =
at
°2θ
FWHM =
at
°2θ
Select Output
List hkl and intensity
List powder pattern
plot powder pattern
Crystal Data
Space Group:
F m m m
(# 69)
Cell parameters:
a
=
22.232 Å
b
=
15.058Å
c
=
13.627 Å
α =
90°
β =
90°
γ =
90 °
Chemical Formula
|
(PenA)
4
|
[
Si
88
O
176
]
-
NON
PenA = C
5
H
13
N = 2-aminopentane =
pentan-2-amine
SMILES: CCCC(C)N
Images:
stick
or
3D
Refinement:
X-ray single crystal refinement, R
w
=0.125
Reference:
Marler, B., Dehnbostel, N., Eulert, H.-H., Gies, H. and Liebau, F.
J. Incl. Phenom.
,
4
, 339-349 (1986)
Atomic Coordinates:
Atom
Form Factor
x
y
z
PP
B(iso)
SI1
Si
0.3745
0.1635
0.3103
1
1.66
SI2
Si
0.2798
0.5
0.5
1
2.05
SI3
Si
0.295
0.327
0
1
2.84
SI4
Si
0.5
0.1051
0.6156
1
0.32
SI5
Si
0.3173
0.5
0.2831
1
2.29
O1
O
0.3356
0.3282
0.9056
1
5.13
O2
O
0.4427
0.1462
0.3374
1
1.97
O3
O
0.352
0.405
0.2525
1
10.11
O4
O
0.2702
0.4329
0
1
12.79
O5
O
0.3197
0.5
0.5937
1
3.4
O6
O
0.3667
0.25
0.25
1
17.13
O7
O
0
0
0.1392
1
2.05
O8
O
0.5
0.1155
0.5
1
0.39
O9
O
0.25
0
0.25
1
1.82
O10
O
0.25
0.25
0
1
9.95
C1
C
0.5
0.4489
0.57
1
19.11
C2
C
0.4659
0.3547
0.5
1
10.11
C3
C
0
0
0.5
1
32.37
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IZA-SC
)