Database of Zeolite Structures
 
Framework Type GON
Powder Diffraction Pattern for GUS-1
Input Parameters
  Wavelength:  or
  2θ range:
  Step size:
  Polarization factor:
  Background:
  Reference peak is
    peak closest to °2θ
    reflection (hkl)
       scaled to
  Intensity axis:
     
Peak shape
  Pseudo-Voigt: (1-n)Gaussian + n Lorentzian
  FWHM = sqrt (U + V tan θ + W tan2θ)
  Mixing parameter (n): %
  Peak range: FWHM
  Peak width:
       set UVW at: U =   V =   W =
       Calculate UVW such that FWHM =
    FWHM =
       FWHM =
   
Select Output
 
List hkl and intensity
List powder pattern
plot powder pattern
Crystal Data
  Space group: C 2 2 2   (# 65)   
  Cell parameters: a = 16.4206 Å b = 20.054Å c = 5.0464 Å
    α = 90° β = 90° γ = 90 °
  Refinement: X-ray powder diffraction.
  Reference: PlÚvert, J., Kubota, Y., Honda, T., Okubo, T. and Sugi, Y.
Chem. Commun., , 2363-2364 (2000)
  Atomic Coordinates:          
   
Atom
Form Factor
x
y
z
PP
B(iso)
   
  Si1
Si
0.3074 0.1879 0.478 1 1.97
  Si2
Si
0.1818 0.0767 0.527 1 1.97
  Si3
Si
0.0937 0.1222 0.016 1 1.97
  Si4
Si
0.0964 0.2819 -0.002 1 1.97
  O1
O
0.3549 0.1874 0.754 1 2.37
  O2
O
0.384 0.2092 0.307 1 2.37
  O3
O
0.25 0.25 0.522 1 2.37
  O4
O
0.2644 0.117 0.477 1 2.37
  O5
O
0.1537 0.0785 0.834 1 2.37
  O6
O
0.212 0 0.5 1 2.37
  O7
O
0.1151 0.1023 0.317 1 2.37
  O8
O
0 0.1006 0 1 2.37
  O9
O
0.1021 0.2021 -0.013 1 2.37
  O10
O
0 0.297 0 1 2.37